30 Sep '17, 4pm

RF devices: Reliability is critical

With communications being such an important part of our lives, reliability of phones and other wireless devices has become critical. It's always been that way for military and aerospace devices, but they no longer have a monopoly on high reliability. Engineers are responsible for designing and testing reliability into RF devices, which was the main point presented by Dr. Chandra Gupta, Senior Engineering Program Manager at Communications & Power Industries (CPI) Beverly Microwave Division . Dr. Gupta spoke to engineers from the Boston chapter of the IEEE Reliability Society on Sept. 13, 2017 at MIT Lincoln Labs. Dr. Chandra Gupta (second from left) with members of the IEEE Reliability Society at MIT Lincoln Labs. Size, weight, power, and cost (SwaP-C) make the job of designing reliable parts ever more difficult. "Everything is getting thinner and smaller," noted Gupta. "Yo...

Full article: https://www.edn.com/electronics-blogs/rowe-s-and-columns/...

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